Efficient and Exact Diagnosis of Multiple Stuck-At Faults

A simulation-based approach to multiple stuck-at fault diagnosis is presented. The algorithm works iteratively as it identifies and fault models a single location at a time so that the functionality of the new netlist gradually resembles that of the corrupted one. The method is based on a theoretical result along with a number of heuristics which help avoid the exponential complexity inherent to the problem. Experiments on multiple stuck-at faults confirm its effectiveness and accuracy which scales well with increasing number of faults. J. Brandon Liu Andreas Veneris Magdy S. Abadir University of Toronto University of Toronto Motorola Dept ECE Dept ECE and CS 7700 W. Parmer Toronto, ON M5S 3G4 ON M5S 3G4 Austin, TX 78729 [email protected] [email protected] [email protected]